Article
Cited 542 time in 
Cited 568 time in 
Cited 568 time in
Metadata Downloads
Critical assessment of charge mobility extraction in FETs SCIE SCOPUS
- Title
- Critical assessment of charge mobility extraction in FETs
- Date Issued
- 2018-01
- Publisher
- NATURE PUBLISHING GROUP
- Abstract
- Mobility is an important charge-transport parameter in organic, inorganic and hybrid semiconductors. We outline some of the common pitfalls of mobility extraction from field-effect transistor (FET) measurements and propose practical recommendations to avoid reporting erroneous mobilities in publications.
- ISSN
- 1476-1122
- Article Type
- Article
- Citation
- NATURE MATERIALS, vol. 17, page. 2 - 7, 2018-01
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 조길원CHO, KIL WON
- Dept. of Chemical Enginrg