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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | KWON, IK HWAN | - |
| dc.contributor.author | HONG, CHUNG KI | - |
| dc.contributor.author | LIM, JUN | - |
| dc.date.accessioned | 2018-05-04T02:34:01Z | - |
| dc.date.available | 2018-05-04T02:34:01Z | - |
| dc.date.created | 2018-03-02 | - |
| dc.date.issued | 2018-01 | - |
| dc.identifier.issn | 0034-6748 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/41193 | - |
| dc.description.abstract | The intensity and direction of the incident beam at the sample position in synchrotron full-field transmission X-ray microscopy is subject to change. Incident-beam fluctuation in computed tomography results in significant contrast degradation of the reconstructed image. In the present study, we devised a simple method by which that problem could be corrected using sinogram normalization. According to our results, the image contrast was improved by 13%, and the artifacts were suppressed. © 2018 Author(s). | - |
| dc.language | English | - |
| dc.publisher | AMER INST PHYSICS | - |
| dc.relation.isPartOf | REVIEW OF SCIENTIFIC INSTRUMENTS | - |
| dc.title | Note: Contrast enhancement and artifact suppression in computed tomography using sinogram normalization | - |
| dc.type | Article | - |
| dc.identifier.doi | 10.1063/1.5004061 | - |
| dc.type.rims | ART | - |
| dc.identifier.bibliographicCitation | REVIEW OF SCIENTIFIC INSTRUMENTS, v.89, no.1, pp.016101-1 - 016101-3 | - |
| dc.identifier.wosid | 000424022400078 | - |
| dc.date.tcdate | 2018-03-23 | - |
| dc.citation.endPage | 016101-3 | - |
| dc.citation.number | 1 | - |
| dc.citation.startPage | 016101-1 | - |
| dc.citation.title | REVIEW OF SCIENTIFIC INSTRUMENTS | - |
| dc.citation.volume | 89 | - |
| dc.contributor.affiliatedAuthor | KWON, IK HWAN | - |
| dc.contributor.affiliatedAuthor | HONG, CHUNG KI | - |
| dc.identifier.scopusid | 2-s2.0-85040198646 | - |
| dc.embargo.liftdate | 2019-03-01 | - |
| dc.embargo.terms | 2019-03-01 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
| dc.description.isOpenAccess | N | - |
| dc.type.docType | Article | - |
| dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Instruments & Instrumentation | - |
| dc.relation.journalResearchArea | Physics | - |
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Related Researcher
- 홍정기HONG, CHUNG KI
- Dept of Physics