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Cited 22 time in webofscience Cited 27 time in scopus
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dc.contributor.authorChoi, Seungnam-
dc.contributor.authorKu, Hwan-Seok-
dc.contributor.authorSon, Hyunwoo-
dc.contributor.authorKIM, BYUNGSUB-
dc.contributor.authorPARK, HONG JUNE-
dc.contributor.authorSIM, JAE YOON-
dc.date.accessioned2018-05-04T02:48:19Z-
dc.date.available2018-05-04T02:48:19Z-
dc.date.created2018-02-06-
dc.date.issued2018-02-
dc.identifier.issn0018-9200-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/41349-
dc.description.abstractThis paper presents an asynchronous-clocking successive approximation register (SAR) analog-to-digital converter (ADC) suitable for ultralow-power fine-precision sensor applications whose signal bandwidth is in the kilohertz range. The performance-limiting issues of comparator noise and capacitor mismatch in SAR ADC are resolved by a residue integration scheme combined with a dynamic element matching (DEM), achieving a high resolution without imposing extra burden on the design of residue amplifier and comparator. The prototype 16-bit 2 kS/s SAR ADC is fabricated using 180-nm CMOS process in an area of 0.68 mm2. Measurements show 84.6-dB signal to noise and distortion ratio and 98.2-dB spurious-free dynamic range at the Nyquist input frequency. The ADC dissipates 7.93 μW from supply voltage of 1.8 V and achieves a Schreier figure of merit of 165.6 dB.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.relation.isPartOfIEEE JOURNAL OF SOLID-STATE CIRCUITS-
dc.subjectApproximation theory-
dc.subjectComparator circuits-
dc.subjectComparators (optical)-
dc.subjectFrequency converters-
dc.subjectSignal to noise ratio-
dc.subjectSurveying-
dc.subjectAnalog to digital converters-
dc.subjectDynamic element matching-
dc.subjectLow power sensor-
dc.subjectNyquist rate-
dc.subjectSuccessive approximation register-
dc.subjectAnalog to digital conversion-
dc.titleAn 84.6-dB-SNDR and 98.2-dB-SFDR Residue-Integrated SAR ADC for Low-Power Sensor Applications-
dc.typeArticle-
dc.identifier.doi10.1109/JSSC.2017.2774287-
dc.type.rimsART-
dc.identifier.bibliographicCitationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.53, no.2, pp.404 - 417-
dc.identifier.wosid000423546800006-
dc.date.tcdate2018-04-06-
dc.citation.endPage417-
dc.citation.number2-
dc.citation.startPage404-
dc.citation.titleIEEE JOURNAL OF SOLID-STATE CIRCUITS-
dc.citation.volume53-
dc.contributor.affiliatedAuthorKu, Hwan-Seok-
dc.contributor.affiliatedAuthorSon, Hyunwoo-
dc.contributor.affiliatedAuthorKIM, BYUNGSUB-
dc.contributor.affiliatedAuthorPARK, HONG JUNE-
dc.contributor.affiliatedAuthorSIM, JAE YOON-
dc.identifier.scopusid2-s2.0-85041296983-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc0-
dc.type.docTypeArticle-
dc.subject.keywordPlusNOISE-
dc.subject.keywordPlusCMOS-
dc.subject.keywordAuthorAnalog-to-digital converter (ADC)-
dc.subject.keywordAuthordynamic element matching (DEM)-
dc.subject.keywordAuthorlow-power sensor application-
dc.subject.keywordAuthorNyquist-rate ADC-
dc.subject.keywordAuthorsuccessive approximation register (SAR) ADC-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-

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김병섭KIM, BYUNGSUB
Dept of Electrical Enginrg
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