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dc.contributor.authorKIM, YOUNG HWAN-
dc.contributor.authorBANG, BYEONG JUN-
dc.contributor.authorKWON,HYUN JEONG-
dc.date.accessioned2018-05-10T06:57:03Z-
dc.date.available2018-05-10T06:57:03Z-
dc.date.created2018-01-31-
dc.date.issued2017-11-07-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/41757-
dc.publisherIEEE-
dc.relation.isPartOfInternational SoC Design Conference (ISOCC 2017)-
dc.relation.isPartOfInternational SoC Design Conference  (ISOCC 2017)-
dc.titleEffective sampling method for statistical leakage analysis: Hybrid sampling method-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationInternational SoC Design Conference (ISOCC 2017), pp.302 - 303-
dc.citation.conferenceDate2017-11-05-
dc.citation.conferencePlaceKO-
dc.citation.conferencePlaceSeoul, Korea-
dc.citation.endPage303-
dc.citation.startPage302-
dc.citation.titleInternational SoC Design Conference (ISOCC 2017)-
dc.contributor.affiliatedAuthorKIM, YOUNG HWAN-
dc.contributor.affiliatedAuthorBANG, BYEONG JUN-
dc.contributor.affiliatedAuthorKWON,HYUN JEONG-
dc.description.journalClass1-
dc.description.journalClass1-

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김영환KIM, YOUNG HWAN
Dept of Electrical Enginrg
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