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Article
Caution: Abnormal Variability Due to Terrestrial Cosmic Rays in Scaled-Down FinFETs
SCIE
SCOPUS
IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 66, no. 4, page. 1887 - 1891, 2019-04
Kim, J.
;
Lee, J.-S.
;
Han, J.-W.
;
Meyyappan, M.
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6-nm node technology
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displacement defect
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FinFET
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TCAD simulation
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variability
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2019
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