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Department of Electrical Engineering (전자전기공학과)
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Article
A BER-Suppressed PUF With an Amplification of Process Mismatch Effect in an Oscillator Collapse Topology
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IEEE Journal of Solid-State Circuits, vol. 57, no. 7, page. 2208 - 2219, 2022-07
Park, Jaehan
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Kim, ByungJun
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Sim, Jae-Yoon
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