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Browsing "2. Conference Papers" by  AuthorGang-jun Kim
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Showing results 1 to 1 of 1
Conference
Method to extract parameters of power law for nano-scale SiON pMOSFETs under negative bias temperature instability
European Symposium on Reliability of Electron Devices,Failure Physics and Analysis, 2018-10-02
KANG, BONG KOO
;
Yeohyeok Yun
;
Gang-jun Kim
;
Ji-Hoon Seo
;
Donghee Son
1
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