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Reducing Line Edge Roughness of PS-b-PMMA pattern using hydrogen bonding located at the interface of the microdomains

Title
Reducing Line Edge Roughness of PS-b-PMMA pattern using hydrogen bonding located at the interface of the microdomains
Authors
LEE, KYU SEONGKIM, JIN KON
Date Issued
2016-04-06
Publisher
한국고분자학회
URI
https://oasis.postech.ac.kr/handle/2014.oak/42502
Article Type
Conference
Citation
한국고분자학회 2016년 춘계학술발표회, 2016-04-06
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김진곤KIM, JIN KON
Dept. of Chemical Enginrg
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