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dc.contributor.author박찬경-
dc.date.accessioned2018-05-22T14:54:32Z-
dc.date.available2018-05-22T14:54:32Z-
dc.date.created2010-02-04-
dc.date.issued2009-09-26-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/43917-
dc.publisherFEMMS-
dc.relation.isPartOfFEMMS-
dc.titleAnalysis of InGaN/GaN Multi Quantum Wells (MQWs) using by Aberration-Corrected Scanning Transmission Electron Microscopes and 3-D Atom Probe Tomography-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationFEMMS-
dc.citation.conferencePlaceGE-
dc.citation.titleFEMMS-
dc.contributor.affiliatedAuthor박찬경-
dc.description.journalClass1-
dc.description.journalClass1-

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박찬경PARK, CHAN GYUNG
Dept of Materials Science & Enginrg
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