Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김광재 | - |
| dc.contributor.author | 김현진 | - |
| dc.contributor.author | 곽도순 | - |
| dc.date.accessioned | 2018-05-22T16:20:45Z | - |
| dc.date.available | 2018-05-22T16:20:45Z | - |
| dc.date.created | 2010-05-05 | - |
| dc.date.issued | 2009-10-11 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/45635 | - |
| dc.publisher | INFORMS | - |
| dc.relation.isPartOf | INFORMS Annual Meeting | - |
| dc.title | Achieving Low Within-wafer Variability in Semi-conductor Manufacturing Process | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | INFORMS Annual Meeting | - |
| dc.citation.title | INFORMS Annual Meeting | - |
| dc.contributor.affiliatedAuthor | 김광재 | - |
| dc.contributor.affiliatedAuthor | 김현진 | - |
| dc.contributor.affiliatedAuthor | 곽도순 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 김광재KIM, KWANG JAE
- Dept. of Industrial & Management Eng.