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dc.contributor.authorKIM, JAE NAM-
dc.contributor.authorKWON, YOUNG JIN-
dc.contributor.authorBYEON, MI RANG-
dc.contributor.authorHONG, TAE EN-
dc.contributor.authorLEE, CHONG SOO-
dc.date.accessioned2018-05-23T09:22:00Z-
dc.date.available2018-05-23T09:22:00Z-
dc.date.created2017-11-13-
dc.date.issued2017-10-19-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/45751-
dc.description.abstractSecondary ion mass spectroscopy (SIMS) is an analytical technique that can be used to characterize the surface and near surface region of solids. One of the advantages of SIMS is the outstanding impurity element detection limits of part per million atomic for most elements. However, SIMS quantification is subject to many effects. Not only the matrix effect of the materials but also the sputtering process will often affect the interpretation of the data [1]. SIMS-Resistive Anode Encoder (RAE) is a powerful tool for mapping the distribution of impurity elements. Hydrogen in high Mn steel was successfully analysed using SIMS-RAE as similar as previous studies of boron analysis in iron and steels using SIMS-RAE [2-3]. “This research was supported by the Korea Basic Science Institute under the R&D program (Project No. D37700) supervised by the Ministry of Science and ICT.”-
dc.languageEnglish-
dc.publisher한국진공학회, 포면측정클럽-
dc.relation.isPartOf제12회 표면분석심포지엄-
dc.relation.isPartOf제12회 표면분석심포지엄 초록집-
dc.titleAnalysis of hydrogen in high Mn steel using SIMS-RAE-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation제12회 표면분석심포지엄-
dc.citation.conferenceDate2017-10-18-
dc.citation.conferencePlaceKO-
dc.citation.conferencePlace경주블루원리조트-
dc.citation.title제12회 표면분석심포지엄-
dc.contributor.affiliatedAuthorKIM, JAE NAM-
dc.description.journalClass2-
dc.description.journalClass2-

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