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Evaluation of the State-of-the Art Statistical Leakage Estimation Methods using the BSIM4 Transistor Model
- Title
- Evaluation of the State-of-the Art Statistical Leakage Estimation Methods using the BSIM4 Transistor Model
- Date Issued
- 2009-12-16
- Publisher
- ISIC
- Article Type
- Conference
- Citation
- The 12th International Symposium on Integrated Circuits (ISIC-2009), 2009-12-16
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Related Researcher
- 김영환KIM, YOUNG HWAN
- Dept of Electrical Enginrg