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Effect of Local Random Variation on Gate-Level Delay and Leakage Statistical Analysis

Title
Effect of Local Random Variation on Gate-Level Delay and Leakage Statistical Analysis
Authors
김영환김재훈김욱
Date Issued
2009-07-16
Publisher
Asia Symposium on Quality Electronic Design(Asqed)
URI
https://oasis.postech.ac.kr/handle/2014.oak/45949
Article Type
Conference
Citation
Asia Symposium on Quality Electronic Design(Asqed) 2009, 2009-07-16
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김영환KIM, YOUNG HWAN
Dept of Electrical Enginrg
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