Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
A Defect Inspection Method for TFT panel using the Compute Unified Device Architecture (CUDA)
- Title
- A Defect Inspection Method for TFT panel using the Compute Unified Device Architecture (CUDA)
- Date Issued
- 2009-07-07
- Publisher
- IEEE KOREA
- Article Type
- Conference
- Citation
- IEEE International Symposium on Industrial Electronics (ISlE 2009), 2009-07-07
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 박부견PARK, POOGYEON
- Dept of Electrical Enginrg