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dc.contributor.author김영환-
dc.contributor.author김진욱-
dc.contributor.author김욱-
dc.date.accessioned2018-05-23T14:50:26Z-
dc.date.available2018-05-23T14:50:26Z-
dc.date.created2010-05-06-
dc.date.issued2008-12-02-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/46022-
dc.publisherIEEE-
dc.relation.isPartOf2008 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS 2008)-
dc.relation.isPartOf2008 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS 2008)-
dc.titleIncremental Statistical Static Timing Analysis with Gate Timing Yield Emphasis-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation2008 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS 2008)-
dc.citation.conferenceDate2008-11-30-
dc.citation.title2008 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS 2008)-
dc.contributor.affiliatedAuthor김영환-
dc.contributor.affiliatedAuthor김진욱-
dc.contributor.affiliatedAuthor김욱-
dc.description.journalClass1-
dc.description.journalClass1-

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김영환KIM, YOUNG HWAN
Dept of Electrical Enginrg
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