Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Reliability of HfO2/SiO2 Dielectric with Strain Engineering using CESL Stressor
- Title
- Reliability of HfO2/SiO2 Dielectric with Strain Engineering using CESL Stressor
- Authors
- 정윤하
- Date Issued
- 2009-04-26
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- 2009 IEEE International Reliability Physics Symposium, 2009-04-26
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg