Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정윤하 | - |
| dc.date.accessioned | 2018-05-23T15:03:49Z | - |
| dc.date.available | 2018-05-23T15:03:49Z | - |
| dc.date.created | 2010-05-10 | - |
| dc.date.issued | 2007-12-06 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/46301 | - |
| dc.publisher | IEEE | - |
| dc.relation.isPartOf | in 38th IEEE Semiconductor Interface Specialists Conference | - |
| dc.relation.isPartOf | 38TH IEEE SEMICONDUCTOR INTERFACE SPECIALISTS CONFERENCE | - |
| dc.title | PBTI Associated Hot Carrier Characteristics of Nano-scale NMOSFETs with Advanced Gate Stack of Metal Gate/High-k Dielectrics | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | in 38th IEEE Semiconductor Interface Specialists Conference, pp.8 | - |
| dc.citation.conferenceDate | 2007-12-06 | - |
| dc.citation.startPage | 8 | - |
| dc.citation.title | in 38th IEEE Semiconductor Interface Specialists Conference | - |
| dc.contributor.affiliatedAuthor | 정윤하 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg