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dc.contributor.author김종규-
dc.contributor.authorDavid J. Poxson-
dc.contributor.authorFrank W. Mont-
dc.contributor.authorMartin F. Schubert-
dc.contributor.authorE. Fred Schubert-
dc.date.accessioned2018-05-23T15:29:27Z-
dc.date.available2018-05-23T15:29:27Z-
dc.date.created2010-05-31-
dc.date.issued2008-10-19-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/46708-
dc.publisherAVS 55th International Symposium & Exhibition-
dc.relation.isPartOfAVS 55th International Symposium & Exhibition-
dc.titleQuantification of porosity and deposition rate of nano-porous films grown by oblique angle deposition-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationAVS 55th International Symposium & Exhibition-
dc.citation.conferenceDate2008-10-19-
dc.citation.conferencePlaceUS-
dc.citation.titleAVS 55th International Symposium & Exhibition-
dc.contributor.affiliatedAuthor김종규-
dc.description.journalClass1-
dc.description.journalClass1-

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김종규KIM, JONG KYU
Dept of Materials Science & Enginrg
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