Full metadata record
DC Field | Value | Language |
dc.contributor.author | 김종규 | - |
dc.contributor.author | Jong-Lam Lee | - |
dc.contributor.author | J. W. Lee | - |
dc.contributor.author | Y. Park | - |
dc.contributor.author | T. Kim | - |
dc.contributor.author | K.-J. Kim | - |
dc.contributor.author | B. Kim | - |
dc.contributor.author | S. W. Ryu | - |
dc.contributor.author | C. Jeon | - |
dc.contributor.author | S. Y. Han | - |
dc.contributor.author | Y -H. Cho | - |
dc.contributor.author | J. H. Je | - |
dc.date.accessioned | 2018-05-23T15:34:21Z | - |
dc.date.available | 2018-05-23T15:34:21Z | - |
dc.date.created | 2010-06-02 | - |
dc.date.issued | 2000-06-21 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/46808 | - |
dc.publisher | 42nd 2000 Electronic Materials Conference | - |
dc.relation.isPartOf | 42nd 2000 Electronic Materials Conference | - |
dc.title | Evidence of band bending at the surface of p-type GaN measured by synchrotron radiation photoemission spectroscopy | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | 42nd 2000 Electronic Materials Conference | - |
dc.citation.conferenceDate | 2000-06-21 | - |
dc.citation.conferencePlace | US | - |
dc.citation.title | 42nd 2000 Electronic Materials Conference | - |
dc.contributor.affiliatedAuthor | 김종규 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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