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A Study on Carrier Injection Velocity in sub-100nm SiGe Channel pMOSFETs Using RF C-V Measurement

Title
A Study on Carrier Injection Velocity in sub-100nm SiGe Channel pMOSFETs Using RF C-V Measurement
Authors
정윤하
Date Issued
2010-06-17
Publisher
대한전자공학회
URI
https://oasis.postech.ac.kr/handle/2014.oak/47121
Article Type
Conference
Citation
2010년도 대한전자공학회 하계종합학술대회, page. 597 - 598, 2010-06-17
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정윤하JEONG, YOON HA
Dept of Electrical Enginrg
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