Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
C-V Characteristics and Analysis of Undoped Gate-All-Around Nanowire FET Array
- Title
- C-V Characteristics and Analysis of Undoped Gate-All-Around Nanowire FET Array
- Authors
- 정윤하
- Date Issued
- 2010-09-24
- Publisher
- The Japan Society of Applied Physics
- Article Type
- Conference
- Citation
- Soild States Devices and Materials, page. 1277 - 1278, 2010-09-24
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg