Reliability properties in sub-50 nm high performance high-k.metal gate stacks SiGe pMOSFETs
- Title
- Reliability properties in sub-50 nm high performance high-k.metal gate stacks SiGe pMOSFETs
- Authors
- 정윤하
- Date Issued
- 2010-10-13
- Publisher
- IEEE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/47215
- Article Type
- Conference
- Citation
- IEEE NMDC(Nanotechnology Materials and Devices conference), page. 38 - 41, 2010-10-13
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