Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
The Temperature Dependence of Threshold Voltage Variations due to Oblique Sing Grain Boundary in 3D NAND unit Cells
- Title
- The Temperature Dependence of Threshold Voltage Variations due to Oblique Sing Grain Boundary in 3D NAND unit Cells
- Authors
- 백창기
- Date Issued
- 2014-10-27
- Publisher
- NVMTS
- Article Type
- Conference
- Citation
- 2014 Non-Volatile Memory Technology Symposium, 2014-10-27
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 백창기BAEK, CHANG KI
- Dept. Convergence IT Engineering