Full metadata record
DC Field | Value | Language |
dc.contributor.author | 백록현 | - |
dc.contributor.author | 손창우 | - |
dc.contributor.author | 강창용 | - |
dc.contributor.author | 최도영 | - |
dc.contributor.author | 사공현철 | - |
dc.contributor.author | 정의영 | - |
dc.contributor.author | 이정수 | - |
dc.contributor.author | P.Kirsch | - |
dc.contributor.author | R.Jammy | - |
dc.contributor.author | J.C.Lee | - |
dc.contributor.author | 정윤하 | - |
dc.date.accessioned | 2018-05-24T11:24:33Z | - |
dc.date.available | 2018-05-24T11:24:33Z | - |
dc.date.created | 2017-02-23 | - |
dc.date.issued | 2012-04-23 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/49477 | - |
dc.publisher | IEEE | - |
dc.relation.isPartOf | IEEE VLSI-TSA (2012) | - |
dc.relation.isPartOf | INTERNATIONAL SYMPOSIUM ON VLSI-TSA | - |
dc.title | Comparative Study of Geometry-dependent Capacitances of Planar FETs and Double-Gate FinFETs: Optimization and Process Variation | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | IEEE VLSI-TSA (2012) | - |
dc.citation.conferencePlace | CH | - |
dc.citation.title | IEEE VLSI-TSA (2012) | - |
dc.contributor.affiliatedAuthor | 백록현 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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