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Characterization and local structure analysis of carbon coated SiOx using confocal μ-Raman microscopy

Title
Characterization and local structure analysis of carbon coated SiOx using confocal μ-Raman microscopy
Authors
강병우김정한
Date Issued
2016-04-07
Publisher
한국전기화학회
URI
https://oasis.postech.ac.kr/handle/2014.oak/49526
Article Type
Conference
Citation
춘계 한국전기화학회, 2016-04-07
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