Interrupted Atom Probe Analysis with TEM Observation for Understanding Field Evaporation Sequences of High-k Dielectric Bulk Oxide Materials
- Title
- Interrupted Atom Probe Analysis with TEM Observation for Understanding Field Evaporation Sequences of High-k Dielectric Bulk Oxide Materials
- Authors
- 박찬경; 곽창민
- Date Issued
- 2016-06-12
- Publisher
- KSM
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/49615
- Article Type
- Conference
- Citation
- Atom Probe Tomography & Microscopy 2016, 2016-06-12
- Files in This Item:
- There are no files associated with this item.
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