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In-situ TEM study of nano-scale conductive filament used for threshold selector device
- Title
- In-situ TEM study of nano-scale conductive filament used for threshold selector device
- Date Issued
- 2016-05-23
- Publisher
- MST33, AAT39
- Article Type
- Conference
- Citation
- 11th Asia-Pacific Microscopy Conference, 2016-05-23
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Related Researcher
- 박찬경PARK, CHAN GYUNG
- Dept of Materials Science & Enginrg