Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Suppression of the Reset Breakdown Failure by using RuO2 Electrode in HfOx-based RRAM
- Title
- Suppression of the Reset Breakdown Failure by using RuO2 Electrode in HfOx-based RRAM
- Authors
- 황현상
- Date Issued
- 2016-02-23
- Publisher
- 한국반도체학술대회
- Article Type
- Conference
- Citation
- 제23회 한국반도체학술대회, 2016-02-23
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 황현상HWANG, HYUNSANG
- Dept of Materials Science & Enginrg