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Cited 5 time in webofscience Cited 6 time in scopus
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Investigation on the Worst Read Scenario of a ReRAM Crossbar Array SCIE SCOPUS

Title
Investigation on the Worst Read Scenario of a ReRAM Crossbar Array
Authors
Youn, YelimKim, KwangminSim, Jae-YoonPark, Hong-JuneKim, Byungsub
Date Issued
2017-09
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Abstract
This paper disproves the worst read scenario of a ReRAM crossbar array. If the previously believed worst read scenario is not the worst one, the read margin evaluated based on the scenario can be incorrect. We explored for read scenario worse than the previously believed worst scenario by wisely sampling scenarios and iteratively searching for the worse one. In experiment, our algorithm successfully found the scenario worse than the previously believed one, disproving the previously believed worst read scenario. Our results show that the sensing window estimated by the incorrect previously believed worst scenario is 14 times as large as the estimation by the worst scenario found by our algorithm.
Keywords
DEVICE CHARACTERISTICS; RRAM; MEMORIES
URI
https://oasis.postech.ac.kr/handle/2014.oak/50410
DOI
10.1109/TVLSI.2017.2710140
ISSN
1063-8210
Article Type
Article
Citation
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, vol. 25, no. 9, page. 2402 - 2410, 2017-09
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김병섭KIM, BYUNGSUB
Dept of Electrical Enginrg
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