A sampling plan for the selection of supplier using process yield index based on linear profiles

Abstract

In this article, a multiple dependent state repetitive (MDSR) sampling plan is developed to choose a more capable process by comparing two suppliers�� processes. The proposed MDSR plan is based on the ratio of two process yield indices based on the estimated linear profiles. The linear profile for both processes is estimated by a regression model with a single explanatory variable having the specified number of levels. The operating characteristic function of the proposed plan will be derived. The plan parameters related to the decision rule as well as the sample size are determined by minimizing the average sample number while satisfying the producer��s and the consumer��s risks. ? 2017 KIIE.