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Cited 10 time in webofscience Cited 9 time in scopus
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dc.contributor.authorAslam, Muhammad-
dc.contributor.authorBalamurali, S.-
dc.contributor.authorJun, Chi-Hyuck-
dc.contributor.authorMeer, Aneela-
dc.date.accessioned2018-06-15T05:40:11Z-
dc.date.available2018-06-15T05:40:11Z-
dc.date.created2017-09-14-
dc.date.issued2017-06-
dc.identifier.issn0361-0918-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/50718-
dc.description.abstractAcceptance sampling, widely used in various production industries, is a very vital tool of quality control. In this paper, a new attribute acceptance-sampling plan is developed based on the exponentially weighted moving average statistic under a time-truncated life test when the product lifetime follows the Weibull distribution or the Burr type X distribution. The performance measures such as the probability of acceptance and the average sample number are derived. Tables are constructed for the selection of optimal parameters of the proposed sampling plan so as to minimize the average sample number satisfying the producer's and the consumer's risks. Illustrative example is also given for the application of the proposed plan. It is also shown that the proposed plan requires a smaller sample size compared to the single sampling plan.-
dc.languageEnglish-
dc.publisherTAYLOR & FRANCIS INC-
dc.relation.isPartOfCOMMUNICATIONS IN STATISTICS-SIMULATION AND COMPUTATION-
dc.subjectLIFE-TEST-
dc.subjectVARIABLES INSPECTION-
dc.titleTime-truncated attribute sampling plans using EWMA for Weibull and Burr type X distributions-
dc.typeArticle-
dc.identifier.doi10.1080/03610918.2015.1105977-
dc.type.rimsART-
dc.identifier.bibliographicCitationCOMMUNICATIONS IN STATISTICS-SIMULATION AND COMPUTATION, v.46, no.6, pp.4173 - 4184-
dc.identifier.wosid000405864600001-
dc.date.tcdate2019-02-01-
dc.citation.endPage4184-
dc.citation.number6-
dc.citation.startPage4173-
dc.citation.titleCOMMUNICATIONS IN STATISTICS-SIMULATION AND COMPUTATION-
dc.citation.volume46-
dc.contributor.affiliatedAuthorJun, Chi-Hyuck-
dc.identifier.scopusid2-s2.0-85017502586-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc1-
dc.type.docTypeArticle-
dc.subject.keywordPlusLIFE-TEST-
dc.subject.keywordPlusVARIABLES INSPECTION-
dc.subject.keywordAuthorExponentially weighted moving average-
dc.subject.keywordAuthortruncated life test-
dc.subject.keywordAuthorBurr X distribution-
dc.subject.keywordAuthorWeibull distribution-
dc.relation.journalWebOfScienceCategoryStatistics & Probability-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMathematics-

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전치혁JUN, CHI HYUCK
Dept of Industrial & Management Enginrg
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