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Cited 65 time in webofscience Cited 72 time in scopus
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dc.contributor.authorBaek, E.-
dc.contributor.authorRim, T.-
dc.contributor.authorSch?tt, J.-
dc.contributor.authorBaek, C.-K.-
dc.contributor.authorKim, K.-
dc.contributor.authorBaraban, L.-
dc.contributor.authorCuniberti, G.-
dc.date.accessioned2018-06-15T05:56:11Z-
dc.date.available2018-06-15T05:56:11Z-
dc.date.created2017-12-21-
dc.date.issued2017-11-
dc.identifier.issn1530-6984-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/51000-
dc.description.abstractWe report the first observation of negative photoconductance (NPC) in n- and p-doped Si nanowire field-effect transistors (FETs) and demonstrate the strong influence of doping concentrations on the nonconventional optical switching of the devices. Furthermore, we show that the NPC of Si nanowire FETs is dependent on the wavelength of visible light due to the phonon-assisted excitation to multiple conduction bands with different band gap energies that would be a distinct optoelectronic property of indirect band gap semiconductor. We attribute the main driving force of NPC in Si nanowire FETs to the photogenerated hot electrons trapping by dopants ions and interfacial states. Finally, comparing back- and top-gate modulation, we derive the mechanisms of the transition between negative and positive photoconductance regimes in nanowire devices. The transition is decided by the competition between the light-induced interfacial trapping and the recombination of mobile carriers, which is dependent on the light intensity and the doping concentration. ? 2017 American Chemical Society.-
dc.languageEnglish-
dc.publisherAmerican Chemical Society-
dc.relation.isPartOfNano Letters-
dc.subjectDoping (additives)-
dc.subjectEnergy gap-
dc.subjectHigh intensity light-
dc.subjectHot electrons-
dc.subjectIII-V semiconductors-
dc.subjectLight-
dc.subjectNanowires-
dc.subjectSemiconducting silicon-
dc.subjectSemiconductor doping-
dc.subjectSilicon-
dc.subjectTransistors-
dc.subjectElectron trapping-
dc.subjectIndirect band gap-
dc.subjectinterfacial trapping-
dc.subjectPhotoconductance-
dc.subjectSi nanowire-
dc.subjectField effect transistors-
dc.titleNegative Photoconductance in Heavily Doped Si Nanowire Field-Effect Transistors-
dc.typeArticle-
dc.identifier.doi10.1021/acs.nanolett.7b02788-
dc.type.rimsART-
dc.identifier.bibliographicCitationNano Letters, v.17, no.11, pp.6727 - 6734-
dc.identifier.wosid000415029000034-
dc.date.tcdate2019-02-01-
dc.citation.endPage6734-
dc.citation.number11-
dc.citation.startPage6727-
dc.citation.titleNano Letters-
dc.citation.volume17-
dc.contributor.affiliatedAuthorBaek, C.-K.-
dc.identifier.scopusid2-s2.0-85033230960-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc8-
dc.type.docTypeArticle-
dc.subject.keywordPlusSILICON NANOWIRES-
dc.subject.keywordPlusSOLAR-CELLS-
dc.subject.keywordPlusPHOTOTRANSISTORS-
dc.subject.keywordPlusRECOMBINATION-
dc.subject.keywordPlusPARAMETERS-
dc.subject.keywordPlusIMPACT-
dc.subject.keywordPlusARRAYS-
dc.subject.keywordPlusINAS-
dc.subject.keywordPlusGE-
dc.subject.keywordAuthorNegative photoconductance-
dc.subject.keywordAuthorhot electron trapping-
dc.subject.keywordAuthorindirect band gap semiconductor-
dc.subject.keywordAuthorSi nanowire-
dc.subject.keywordAuthorinterfacial trapping-
dc.relation.journalWebOfScienceCategoryChemistry, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryChemistry, Physical-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-

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백창기BAEK, CHANG KI
Dept. Convergence IT Engineering
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