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Cited 13 time in webofscience Cited 13 time in scopus
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dc.contributor.authorCho, Hyeonsu-
dc.contributor.authorKim, Kihyun-
dc.contributor.authorYoon, Jun-Sik-
dc.contributor.authorRim, Taiuk-
dc.contributor.authorMeyyappan, M.-
dc.contributor.authorBaek, Chang-Ki-
dc.date.accessioned2018-06-15T05:56:26Z-
dc.date.available2018-06-15T05:56:26Z-
dc.date.created2017-12-21-
dc.date.issued2017-05-
dc.identifier.issn1530-437X-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/51005-
dc.description.abstractInversion-mode (IM) and depletion-mode (DM) ion-sensitive field effect transistors (ISFETs) are investigated in terms of dc characteristics, pH response and low-frequency noise (LFN) characteristics. The dc characteristics show a low threshold voltage (VTH) of 28 mV for the DM ISFETs, which is preferred for the long lifetime of the pseudo-reference electrode. The DM ISFETs exhibit an enhanced pH response in the sub-threshold region, which comes from the lower sub-threshold swing. The LFN analysis for both devices shows similar level of noise equivalent current (In.RMS) near VTH; otherwise, a reduction of In.RMS is obtained in the DM ISFETs in the linear region. In addition, the signal-to-noise ratio of the DM ISFETs is improved by 82.9% compared with the IM ISFETs in the sub-threshold region. Consequently, the DM ISFETs can be a better sensor platform for low-power, portable, and high-precision performance. ? 2001-2012 IEEE.-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.relation.isPartOfIEEE Sensors Journal-
dc.titleOptimization of Signal to Noise Ratio in Silicon Nanowire ISFET Sensors-
dc.typeArticle-
dc.identifier.doi10.1109/JSEN.2017.2674672-
dc.type.rimsART-
dc.identifier.bibliographicCitationIEEE Sensors Journal, v.17, no.9, pp.2792 - 2796-
dc.identifier.wosid000399767900026-
dc.date.tcdate2019-02-01-
dc.citation.endPage2796-
dc.citation.number9-
dc.citation.startPage2792-
dc.citation.titleIEEE Sensors Journal-
dc.citation.volume17-
dc.contributor.affiliatedAuthorCho, Hyeonsu-
dc.contributor.affiliatedAuthorBaek, Chang-Ki-
dc.identifier.scopusid2-s2.0-85018983076-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc1-
dc.type.docTypeArticle-
dc.subject.keywordPlusFIELD-EFFECT TRANSISTORS-
dc.subject.keywordPlusBIOSENSOR-
dc.subject.keywordPlusBEHAVIOR-
dc.subject.keywordPlusUREA-
dc.subject.keywordPlusPH-
dc.subject.keywordAuthorIon-sensitive field effect transistor-
dc.subject.keywordAuthorchannel doping-
dc.subject.keywordAuthorhoneycomb structure-
dc.subject.keywordAuthorlow frequency noise-
dc.subject.keywordAuthorpH sensor-
dc.subject.keywordAuthordepletion-mode-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryInstruments & Instrumentation-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaInstruments & Instrumentation-
dc.relation.journalResearchAreaPhysics-

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백창기BAEK, CHANG KI
Dept. Convergence IT Engineering
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