Full metadata record
DC Field | Value | Language |
dc.contributor.author | 이기봉 | - |
dc.date.accessioned | 2018-06-15T06:43:44Z | - |
dc.date.available | 2018-06-15T06:43:44Z | - |
dc.date.created | 2009-04-29 | - |
dc.date.issued | 2009-04-24 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/51506 | - |
dc.publisher | 한국 세라믹 학회 | - |
dc.relation.isPartOf | 한국 세라믹 학회 | - |
dc.relation.isPartOf | 한국 세라믹학회 초록집 | - |
dc.title | Resonant x-ray scattering as a spectroscopy probe : applications for oxides | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | 한국 세라믹 학회 | - |
dc.citation.conferenceDate | 2009-04-23 | - |
dc.citation.conferencePlace | KO | - |
dc.citation.title | 한국 세라믹 학회 | - |
dc.contributor.affiliatedAuthor | 이기봉 | - |
dc.description.journalClass | 2 | - |
dc.description.journalClass | 2 | - |
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