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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박찬경 | - |
| dc.contributor.author | 구길호 | - |
| dc.contributor.author | 이한보람 | - |
| dc.contributor.author | 김형준 | - |
| dc.date.accessioned | 2018-06-15T07:21:17Z | - |
| dc.date.available | 2018-06-15T07:21:17Z | - |
| dc.date.created | 2009-08-12 | - |
| dc.date.issued | 2008-09-02 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/52199 | - |
| dc.publisher | IUCr | - |
| dc.relation.isPartOf | International Union of Crystallography | - |
| dc.title | Quantitative Atomic-Scale Analysis of Interface Structure of CoSi2 on polycrystalline and single crystalline silicon using by STEM-HAADF and 3D-AP | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | International Union of Crystallography | - |
| dc.citation.conferencePlace | JA | - |
| dc.citation.title | International Union of Crystallography | - |
| dc.contributor.affiliatedAuthor | 박찬경 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 박찬경PARK, CHAN GYUNG
- Dept of Materials Science & Enginrg