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Conference
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dc.contributor.author강봉구-
dc.date.accessioned2018-06-15T07:34:09Z-
dc.date.available2018-06-15T07:34:09Z-
dc.date.created2009-08-13-
dc.date.issued2008-08-20-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/52476-
dc.publisherKDIA-
dc.relation.isPartOf미래디스플레이 산업정책포럼 및 제3회 디스플레이 국가연구개발사업 총괄워크샆-
dc.title회로 장기 신뢰성 검증 장치 개발-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation미래디스플레이 산업정책포럼 및 제3회 디스플레이 국가연구개발사업 총괄워크샆-
dc.citation.conferenceDate2008-08-20-
dc.citation.conferencePlaceKO-
dc.citation.title미래디스플레이 산업정책포럼 및 제3회 디스플레이 국가연구개발사업 총괄워크샆-
dc.contributor.affiliatedAuthor강봉구-
dc.description.journalClass2-
dc.description.journalClass2-

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강봉구KANG, BONG KOO
Dept of Electrical Enginrg
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