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dc.contributor.author강봉구-
dc.date.accessioned2018-06-15T07:44:54Z-
dc.date.available2018-06-15T07:44:54Z-
dc.date.created2009-08-13-
dc.date.issued2002-01-01-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/52707-
dc.publisher컴퓨터/반도체 소사이어티 추계학술대회-
dc.relation.isPartOf컴퓨터/반도체 소사이어티 추계학술대회-
dc.relation.isPartOf컴퓨터/반도체 소사이어티 추계학술대회-
dc.titleHot carrier 스트레스에 의한 LDD n-MOSFET의 열화 특성 파악 및 새로운 Idlin 열화 모델 구현-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation컴퓨터/반도체 소사이어티 추계학술대회, pp.395 - 398-
dc.citation.conferenceDate2002-01-01-
dc.citation.conferencePlaceKO-
dc.citation.endPage398-
dc.citation.startPage395-
dc.citation.title컴퓨터/반도체 소사이어티 추계학술대회-
dc.contributor.affiliatedAuthor강봉구-
dc.description.journalClass2-
dc.description.journalClass2-

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강봉구KANG, BONG KOO
Dept of Electrical Enginrg
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