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dc.contributor.author김장우-
dc.date.accessioned2018-06-17T09:53:42Z-
dc.date.available2018-06-17T09:53:42Z-
dc.date.created2011-02-27-
dc.date.issued2009-03-25-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/56879-
dc.publisherIEEE-
dc.relation.isPartOfIEEE Workshop On Silicon Error in Logic - System Effects-
dc.relation.isPartOfPROCEEDINGS OF IEEE WORKSHOP ON SILICON ERROR IN LOGIC - SYSTEM EFFECTS-
dc.titleModeling SRAM Failure Rates to Enable Fast, Dense, Low-Power Caches-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationIEEE Workshop On Silicon Error in Logic - System Effects-
dc.citation.conferenceDate2009-03-24-
dc.citation.conferencePlaceUS-
dc.citation.titleIEEE Workshop On Silicon Error in Logic - System Effects-
dc.contributor.affiliatedAuthor김장우-
dc.description.journalClass1-
dc.description.journalClass1-

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김장우KIM, JANGWOO
Dept of Computer Science & Enginrg
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