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dc.contributor.author오상호-
dc.contributor.author김영민-
dc.contributor.author유승조-
dc.contributor.author유인근-
dc.contributor.author유석재-
dc.date.accessioned2018-06-17T10:27:05Z-
dc.date.available2018-06-17T10:27:05Z-
dc.date.created2011-03-29-
dc.date.issued2010-09-22-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/57466-
dc.publisherInternational Microscopy Congress-
dc.relation.isPartOf17th International Microscopy Congress (IMC 17)-
dc.titleInterfacial Strain Analysis and Spatial Distribution of Geometrical Misfit Dislocations in a GaN/Sapphire Interface-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation17th International Microscopy Congress (IMC 17)-
dc.citation.conferenceDate2010-09-19-
dc.citation.conferencePlaceBL-
dc.citation.title17th International Microscopy Congress (IMC 17)-
dc.contributor.affiliatedAuthor오상호-
dc.description.journalClass1-
dc.description.journalClass1-

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오상호OH, SANG HO
Dept of Materials Science & Enginrg
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