Full metadata record
DC Field | Value | Language |
dc.contributor.author | 오상호 | - |
dc.contributor.author | 김영민 | - |
dc.contributor.author | 유승조 | - |
dc.contributor.author | 유인근 | - |
dc.contributor.author | 유석재 | - |
dc.date.accessioned | 2018-06-17T10:27:05Z | - |
dc.date.available | 2018-06-17T10:27:05Z | - |
dc.date.created | 2011-03-29 | - |
dc.date.issued | 2010-09-22 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/57466 | - |
dc.publisher | International Microscopy Congress | - |
dc.relation.isPartOf | 17th International Microscopy Congress (IMC 17) | - |
dc.title | Interfacial Strain Analysis and Spatial Distribution of Geometrical Misfit Dislocations in a GaN/Sapphire Interface | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | 17th International Microscopy Congress (IMC 17) | - |
dc.citation.conferenceDate | 2010-09-19 | - |
dc.citation.conferencePlace | BL | - |
dc.citation.title | 17th International Microscopy Congress (IMC 17) | - |
dc.contributor.affiliatedAuthor | 오상호 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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