In-situ Synchrotron X-ray Measurement of thin Film Growth by Atomic Layer Deposition
- Title
- In-situ Synchrotron X-ray Measurement of thin Film Growth by Atomic Layer Deposition
- Authors
- 백성기; 박용준
- Date Issued
- 2009-11-20
- Publisher
- 한국 방사광이용자협회 (KOSUA)
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/58539
- Article Type
- Conference
- Citation
- The 21th Synchrotron Radiation User's Workshop, 2009-11-20
- Files in This Item:
- There are no files associated with this item.
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