Full metadata record
DC Field | Value | Language |
dc.contributor.author | 이기봉 | - |
dc.contributor.author | 황상윤 | - |
dc.contributor.author | 조병관 | - |
dc.contributor.author | 박용준 | - |
dc.date.accessioned | 2018-06-18T01:23:26Z | - |
dc.date.available | 2018-06-18T01:23:26Z | - |
dc.date.created | 2011-04-16 | - |
dc.date.issued | 2011-04-13 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/58578 | - |
dc.publisher | 한국물리학회 | - |
dc.relation.isPartOf | 한국물리학회 2011년 봄학술논문발표회 | - |
dc.relation.isPartOf | 한국물리학회 회보 | - |
dc.title | Model Independent Analysis Method of Ultra-thin Film Thickness in X-ray Reflectivity Measurement | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | 한국물리학회 2011년 봄학술논문발표회, pp.99 | - |
dc.citation.conferenceDate | 2011-04-13 | - |
dc.citation.conferencePlace | KO | - |
dc.citation.endPage | 99 | - |
dc.citation.startPage | 99 | - |
dc.citation.title | 한국물리학회 2011년 봄학술논문발표회 | - |
dc.contributor.affiliatedAuthor | 이기봉 | - |
dc.description.journalClass | 2 | - |
dc.description.journalClass | 2 | - |
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.