In-situ TEM Biasing Experiments to Study Thickness-dependent Ferroelectric Domain Switching of Pb(Zr,Ti)O3 Films
- Title
- In-situ TEM Biasing Experiments to Study Thickness-dependent Ferroelectric Domain Switching of Pb(Zr,Ti)O3 Films
- Authors
- 오상호; 신가영; 이호녕; 구길호; 임지성
- Date Issued
- 2011-10-19
- Publisher
- IEEE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/61129
- Article Type
- Conference
- Citation
- IEEE NMDC 2011, 2011-10-19
- Files in This Item:
- There are no files associated with this item.
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