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dc.contributor.author김준원-
dc.contributor.author최덕현-
dc.contributor.author황운봉-
dc.contributor.author윤의성-
dc.contributor.author김동식-
dc.date.accessioned2018-06-18T04:56:49Z-
dc.date.available2018-06-18T04:56:49Z-
dc.date.created2012-04-23-
dc.date.issued2004-11-07-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/61491-
dc.publisherInternational Association for Nanotechnology-
dc.relation.isPartOf2004 International Congress of Nanotechnology (ICNT 2004)-
dc.relation.isPartOfICNT 2004-
dc.titleMeasurement of Frictional Forces using Atomic Force Microscopy-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation2004 International Congress of Nanotechnology (ICNT 2004)-
dc.citation.conferenceDate2004-11-07-
dc.citation.conferencePlaceUS-
dc.citation.title2004 International Congress of Nanotechnology (ICNT 2004)-
dc.contributor.affiliatedAuthor김준원-
dc.contributor.affiliatedAuthor최덕현-
dc.contributor.affiliatedAuthor황운봉-
dc.contributor.affiliatedAuthor김동식-
dc.description.journalClass1-
dc.description.journalClass1-

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황운봉HWANG, WOON BONG
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