Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Hot Carrier Effect on RF Characteristics of High-k/Metal Gate SiGe Channel pMOSFETs
- Title
- Hot Carrier Effect on RF Characteristics of High-k/Metal Gate SiGe Channel pMOSFETs
- Authors
- 정윤하
- Date Issued
- 2011-09-29
- Publisher
- The Japan Society of Applied Physics
- Article Type
- Conference
- Citation
- 2011 International Conference on Solid State and Device Materials, 2011-09-29
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg