Fabrication and Characterization of Gate-All-Around Silicon Nanowire Field Effect Transistors
- Title
- Fabrication and Characterization of Gate-All-Around Silicon Nanowire Field Effect Transistors
- Authors
- 정윤하
- Date Issued
- 2011-08-16
- Publisher
- IEEE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/61506
- Article Type
- Conference
- Citation
- International Conference on Nanotechnology, 2011-08-16
- Files in This Item:
- There are no files associated with this item.
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