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Low-Frequency Noise Behavior of La-Doped HfSiON/Metal Gate nMOSFETs
- Title
- Low-Frequency Noise Behavior of La-Doped HfSiON/Metal Gate nMOSFETs
- Authors
- 정윤하
- Date Issued
- 2011-04-14
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- International Reliability Physics Symposium, 2011-04-14
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Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg