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Investigation of GIDL Behavior in Si-Nanowire FET with Hot Carrier Stress
- Title
- Investigation of GIDL Behavior in Si-Nanowire FET with Hot Carrier Stress
- Authors
- 정윤하
- Date Issued
- 2011-02-18
- Publisher
- Korean Conference on Semiconductors
- Article Type
- Conference
- Citation
- 18th Korean Conference on Semiconductors, 2011-02-18
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Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg