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Reliability Properties in sub-50nm High Performance High-k/Metal Gate Stacks SiGe pMOSFETs
- Title
- Reliability Properties in sub-50nm High Performance High-k/Metal Gate Stacks SiGe pMOSFETs
- Authors
- 정윤하
- Date Issued
- 2010-10-13
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- Nanotechnology Materials and Devices Conference, 2010-10-13
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Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg