Full metadata record
DC Field | Value | Language |
dc.contributor.author | 정윤하 | - |
dc.date.accessioned | 2018-06-18T04:58:11Z | - |
dc.date.available | 2018-06-18T04:58:11Z | - |
dc.date.created | 2012-04-27 | - |
dc.date.issued | 2010-10-13 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/61516 | - |
dc.publisher | IEEE | - |
dc.relation.isPartOf | Nanotechnology Materials and Devices Conference | - |
dc.relation.isPartOf | 2010 IEEE NANOTECHNOLOGY MATERIALS AND DEVICES CONFERENCE | - |
dc.title | Comparative study of C-V characteristics in Si-NWFET and MOSFET | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | Nanotechnology Materials and Devices Conference | - |
dc.citation.conferencePlace | US | - |
dc.citation.title | Nanotechnology Materials and Devices Conference | - |
dc.contributor.affiliatedAuthor | 정윤하 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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