Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정윤하 | - |
| dc.date.accessioned | 2018-06-18T05:08:52Z | - |
| dc.date.available | 2018-06-18T05:08:52Z | - |
| dc.date.created | 2012-08-10 | - |
| dc.date.issued | 2012-07-26 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/61716 | - |
| dc.publisher | IUPAP | - |
| dc.relation.isPartOf | International Conference on Superlattices, Nanostructures, and Nanodevices | - |
| dc.title | Intrinsic Reliability Improvement of SiGe Quantum Well pMOSFETs | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | International Conference on Superlattices, Nanostructures, and Nanodevices | - |
| dc.citation.conferenceDate | 2012-07-22 | - |
| dc.citation.conferencePlace | GE | - |
| dc.citation.title | International Conference on Superlattices, Nanostructures, and Nanodevices | - |
| dc.contributor.affiliatedAuthor | 정윤하 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg